The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 1978

Filed:

Jul. 15, 1976
Applicant:
Inventors:

Jesse P Lerma, La Habra, CA (US);

Charles A Lindquist, Whittier, CA (US);

Assignee:

Odetics, Inc., Anaheim, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G04F / ; H04B / ; G06M / ;
U.S. Cl.
CPC ...
364514 ; 325325 ; 328 39 ; 364484 ; 364554 ;
Abstract

In a system wherein transitions occur in a data signal encoded with a known format and transition displacements occur as a result of bandwidth limitations, noise, and the like, there is disclosed a method and means for measuring the probability density function associated with such transition displacements. Furthermore, the present system permits the measurement of conditional probability such that the probability density function associated with certain selected transitions can be separately evaluated. The probability density function associated with transition displacements is measured by measuring the average frequency of occurrence of transitions of the data within a narrow, first time interval, varying the first time interval over a larger, second time interval during which transitions of the data are expected to occur, and plotting the average frequency of occurrence of data transitions determined at each first interval.


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