The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 1978
Filed:
Jan. 19, 1977
Arlan Warren Mantz, Acton, MA (US);
Block Engineering, Inc., Cambridge, MA (US);
Abstract
A system for analyzing a time-varying phenomenon in which the latter is repetitively initiated and a spectral output is generated during the course of each successive phenomenon. The output spectrum is repetitively scanned by a fast Fourier transform interferometer to produce an interferogram. The time relation between a selected retardation point in the interferometer and the initiation of each phenomenon is successively shifted so as to produce an ordered set of interferograms each representing a different time relation between initiation and scanning. Data corresponding to a selected temporal resolution element having a fixed time position following initiation of the phenomenon are selected from each of the ordered set of interferograms and the selected data are then reassembled in the same order as the interferograms from which they were taken, to produce a synthetic interferogram. The synthetic interferogram, when inversely transformed, provides the spectrum of the phenomenon as it appeared during that selected temporal resolution element.