The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 1978

Filed:

Aug. 20, 1976
Applicant:
Inventors:

Hewitt David Crane, Portola Valley, CA (US);

Daniel Errol Wolf, Menlo Park, CA (US);

Assignee:

Stanford Research Institute, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
3401 / ; 3401 / ;
Abstract

When signals derived from a template signature are to be compared directly with signals derived from a specimen signature, because no two signatures are alike, there is a requirement for providing a certain degree of 'rubberiness' between the specimen and template signals. Previously such rubberiness was achieved by breaking the signal up into fixed portions and then conducting translation, stretch and contraction between these fixed portions in the course of the comparison. In this invention, advantage is taken of the existence of prominent landmarks in the template and specimen signatures, and the signatures are broken up between these landmarks for the purpose of achieving rubberiness and/or translation. The landmarks in the signals derived from the signatures to be compared are exactly aligned before the correlation process is undertaken.


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