Radiation reflection method and apparatus particularly for gauging

Abstract

Methods and apparatus are provided for gauging the thickness or other property of a plastic film such as blown film or other material having a front side, a back side, and characteristics including a substantial transparency to radiation at a reference wavelength and a degree of transparency depending on the value of the property at an absorption wavelength. These methods and apparatus provide a useful measurement of the material property in the presence or absence of detrimental effects such as those caused by a broadband absorbing substance (e.g. carbon black) or scattering substance (e.g. TiO.sub.2) in the material, or variations in the apparent reflectivity of one or both of the surfaces on the front and back sides, as a result, for example, of the minute surface irregularities in high-density polyethylene. Radiations, typically infrared radiations at the reference and absorption wavelengths, are directed into the front side of the material, and reflected radiations including the reference and absorption wavelengths are detected from the front side at the specular reflection angle. From the detected radiations there is produced an instrument response wherein the effects of the reference and absorption wavelengths reflected from the front side have been selectively subdued, whereby the response is indicative of the value of the property primarily as a function of the reference and absorption wavelengths reflected from the back side of the material. Typically the method is performed by additionally directing into the front side of the material a third wavelength, (e.g. 3.43 microns) to which the material exhibits a substantial opacity, additionally detecting from the front side at the specular reflection angle reflected third wavelength radiation, and producing the response so that the principal effects therein of the reference and absorption wavelengths reflected from the front side are cancelled by the effect of the third wavelength. Typically the method includes directing into the front side of the material a second reference wavelength of radiation, detecting the reflected second wavelength from the front side at the specular reflection angle, and producing from the detected first and second reference wavelengths a composite reference component of the instrument response, derived in accordance with a function which relates the relative intensities of the reflected first and second reference wavelengths to the differences in wavelength among the absorption and first and second reference wavelengths.