The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 1978

Filed:

Oct. 07, 1976
Applicant:
Inventor:

Tsuneji Koshikawa, Sayama, JA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S / ;
U.S. Cl.
CPC ...
340 / ; 340 / ; 340 / ;
Abstract

An object recognition system wherein, in order to derive the features of an object to-be-recognized such as shape and size from a reflected wave or echo, the ratio between a signal obtained by Fourier transforming a part of a transmitting wave for the object and a signal obtained by Fourier transforming a received reflecting wave is subjected to the inverse Fourier transform so as to obtain separate reflection signals corresponding to a large number of reflecting points of the object, whereby the features of the object are recognized by utilizing the reflection signals.


Find Patent Forward Citations

Koshikawa, Tsuneji. (1978). Object recognition system (U.S. Patent No. 4084148). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4084148

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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