The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 1978

Filed:

Sep. 27, 1976
Applicant:
Inventor:

Takashi Inoue, Takasaki, JA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01G / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
2323 / ; 2325 / ; 23259 ; 177114 ; 426231 ;
Abstract

A novel automatic apparatus for preparing a sample for analysis and a novel method for preparation of the sample are provided, whereby specified fractions of plural liquid samples can be automatically and successively collected by distillation. The apparatus comprises an inert gas charging means, a multi-way selector liquid sampler means operated by a timer, a liquid sample charging and discharging means operated by a timer, a distillation still, a fraction selector means and fraction receivers, which are connected in that order by pipe lines. The apparatus and method are especially useful, for example, for preparing a sample for analysis of a diacetyl-odor component and a sample for Kjeldahl determination method.


Find Patent Forward Citations

Inoue, Takashi. (1978). Automatic preparation of sample for analysis (U.S. Patent No. 4083690). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4083690

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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