The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 1978
Filed:
Oct. 19, 1976
Mitsubishi Kasei Kogyo Kabushiki Kaisha, Tokyo, JA;
Abstract
In a method of tension stress testing of rubber of the type wherein a rubber sample is elongated continuously at a predetermined speed and the tension stress is measured when the distance between a pair of reference positions set on the surface of the sample shows a predetermined elongation, prior to the actual test, a plurality of rubber samples having different hardness are elongated continuously under predetermined tension test conditions, the tension stress measuring time between the time of commencing the continuous elongation and a time at which the distance between the reference positions is measured, and by utilizing the data thus obtained and the data regarding the hardness of respective rubber samples, the measuring time function of the tension stress measuring time regarding the hardness is determined by a statistical method. In the actual test, the hardness of a rubber sample is measured, the tension stress measuring time is determined from the measured value of the hardness in accordance with the measuring time function, then the rubber sample is elongated continuously under said tension test conditions, and the stress is measured at the tension stress measuring time to determine the tension stress. SU