The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 1978
Filed:
Mar. 07, 1977
Applicant:
Inventors:
Robert B Thompson, Thousand Oaks, CA (US);
George A Alers, Thousand Oaks, CA (US);
Assignee:
Rockwell International Corporation, El Segundo, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01B / ;
U.S. Cl.
CPC ...
73597 ; 73643 ; 73 8 / ;
Abstract
Stress in a material is measured using electromagnetically generated, transverse elastic waves. A correlation is known to exist between the difference in velocity of orthogonally polarized transverse waves in the type material being measured and stress in the material. An electromagnetic transducer is used to generate orthogonally polarized waves traveling through the part at different velocities as a result of anisotropic stress in the part. The difference in velocity between the polarized waves is measured and compared to the correlation to obtain the stress existing in the part.