The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 1978
Filed:
Sep. 29, 1976
Millard D Longman, Jr, Hialeah, FL (US);
Coulter Electronics, Inc., Hialeah, FL (US);
Abstract
In multiple aperture electronic particle detecting apparatus, there are variations in the physical construction of the apertures intended to be identical, as a result of which the signals produced by the identical sized particle, if passed through all of the apertures, will not be identical. Each apparatus in which a multiple aperture arrangement is used requires many adjustments to be made in balancing the apparatus to compensate for the variations in the signals produced. A method and electronic circuit are disclosed which enable simplified balancing of the detecting means of the apparatus without the need for the many adjustments required heretofore. Particles of unknown size in suspension are passed through the apertures and the current supplied to all but one of the apertures is adjusted to render the signals produced of equal amplitude. The detecting means may be balanced by passing particles of a known suspension, which have a known size, through the apertures and adjusting the current supplied to all but one of the apertures to render the signals produced of equal amplitude. It is immaterial whether the particles are monosized or have a moderately broad size distribution.