The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 1978

Filed:

Aug. 19, 1976
Applicant:
Inventor:

Windell N Mohon, Winter Park, FL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356124 ; 250550 ; 356111 ;
Abstract

An instrument for measuring various and sundry parameters that are analog to the aberrations that may exist in holographic lenses and other energy diffraction apparatus is disclosed as containing: a laser energy source; a pair of masks for controlling precisely the path of the light from said laser energy source, so that it may be used as a reference parameter; a rotatable mounting table for holding the holographic lens being tested in an appropriate position in the path of said reference laser light path; a microscope positioned to receive predetermined laser light rays that have been diffracted by the holographic lens being tested; indicia to measure the X, Y and Z axes distances between that point on the holographic lens being tested where the aforesaid laser light path passes therethrough and a given point position on or with respect to said microscope; and a support bench upon which all of the aforesaid elements may be mounted, so that their respective relative positions may be controlled in such manner that they form a unique geometrical configuration and combination.


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