The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 1978

Filed:

Mar. 26, 1976
Applicant:
Inventors:

Kaoru Takasuka, Fuji, JA;

Masatatsu Takahashi, Fuji, JA;

Sadaji Nishimura, Fuji, JA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250562 ; 250572 ; 356238 ;
Abstract

Disclosed is a non-woven fabric defect detecting device in which light is applied to a travelling non-woven fabric to optically or electrically scan the non-woven fabric in its widthwise direction and the light from each point on the non-woven fabric is converted into an electric signal. The converted electric signal is classified into a plurality of levels to detect at least a hole and a heavy filling bar. The durations of these detected outputs are counted in the form of clocks and grading of the quality of the non-woven value is achieved based on the count values. The abovesaid converted output is differentiated and the differentiated output above a predetermined level is detected as fold bar.


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