The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 1978

Filed:

Jul. 12, 1976
Applicant:
Inventors:

Roger H Tancrell, Cambridge, MA (US);

William W Stoner, Watertown, MA (US);

David T Wilson, Billerica, MA (US);

Assignee:

Raytheon Company, Lexington, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01T / ;
U.S. Cl.
CPC ...
2503 / ; 250366 ; 250368 ;
Abstract

An imaging system utilizing a scintillation camera for photographing subjects emitting gamma and X-radiation. Masks are sequentially positioned between the subject and the camera to produce a sequence of shadowgrams upon the face of the camera. Output signals of the camera are summed together to give an array of sum signals, the array of sum signals being Fourier transformed followed by a matched filtering by multiplication of the frequency terms by an array of factors utilized in generating the masks. Phase factors are applied to the camera output signals, either before the Fourier transformation or during the matched filtering, the phase factors identifying the masks utilized in producing the respective shadowgrams. An inverse Fourier transformation then results in an image of the subject.


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