The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 1978

Filed:

Jan. 12, 1976
Applicant:
Inventor:

Jean Robert Perilhou, Bourg la Reine, FR;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T / ; G01T / ;
U.S. Cl.
CPC ...
2503 / ; 2504 / ;
Abstract

Each point which can be detected in the tomography plane is localized as the intersection of at least two intersecting 'examination lines', each of which is defined by the position of two detectors whose inputs are coupled to a time coincidence circuit. The time coincidence circuits for each of the points per pair of intersecting examination lines are coupled to a contrast circuit which supplies the product of the numbers of strikes detected in time coincidence during a time interval T. After each time interval T, the contrast circuit actuates a monostable circuit which powers a microincandescent lamp for a period of time which is a function of this product.


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Perilhou, Jean. (1978). Gamma-radiation tomography system (U.S. Patent No. 4075482). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4075482

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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