The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 1978
Filed:
Jun. 07, 1976
Donald L Horrocks, Placentia, CA (US);
Beckman Instruments, Inc., Fullerton, CA (US);
Abstract
Method and apparatus for measuring the degree of quench in a liquid scintillation sample by irradiating the sample with a standard source, such as a cesium-137 gamma source, to produce a Compton scattered electron distribution exhibiting a Compton edge configuration as the leading edge thereof. For increasing the quench levels in the sample, the Compton edge shifts to lower pulse height values and the extent of this shift is indicative of the degree of quench. To measure the degree of quench, a unique point on the Compton edge, namely the point at which the second derivative of the edge is zero (i.e. the inflection point), is measured for the quenched sample and the pulse height value corresponding to the inflection point is determined. The pulse height value is compared with the pulse height value determined for a calibration standard in a similar manner, the difference in pulse height values indicating the degree of quench.