The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 1978
Filed:
Mar. 04, 1976
Applicant:
Inventors:
John R Reeher, Los Gatos, CA (US);
Michael S Story, Los Gatos, CA (US);
Ronald D Smith, Bovingdon, EN;
Assignee:
Finnigan Corporation, Sunnyvale, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250281 ; 250292 ;
Abstract
In a mass spectrometer a focusing ion lens system effectively separates charged from neutral particles by forming a potential well along the axis from the ionizing region to the mass analyzer by the use of a gridded lens system. The grids by the use of a high-low voltage combination form the potential well while at the same time allowing nonselected neutral particles to pass through the grid. Thus, the system is very effective for relatively high pressure ionizing regions where a large amount of neutral particles are generated.