The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 1978

Filed:

Mar. 10, 1976
Applicant:
Inventors:

Ulrich Grisar, Georgsmarienhutte, DT;

Wilhelm Berstermann, Georgsmarienhutte, DT;

Assignee:

Klockner-Werke AG, Duisburg, DT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ; G01J / ;
U.S. Cl.
CPC ...
356 81 ; 356 77 ; 356 79 ; 356 86 ;
Abstract

An alloy to be tested is formed of a basis metal and a plurality of alloying elements. A diffraction spectrum having lines corresponding to the basis metal and to each of the alloying elements is generated from the alloy by sparking and electrical signals each having an intensity proportional to the intensity of a respective one of the lines of the spectrum are formed. Each of these signals is integrated and the integrated signals corresponding to lines of the alloy elements are each compared with the integrated signal corresponding to the line of the basis metal and difference signals are generated. These difference signals are evaluated by being passed through a threshold circuit which sounds an alarm when they lie outside a predetermined range. The device can be calibrated by comparing each of the signals corresponding to one of the alloying elements with only a portion of the signal corresponding to the basis metal so that the arrangement can be set up to generate an output only when the alloy being sampled has a composition different from a predetermined calibrated composition.


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