The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 1978

Filed:

Feb. 16, 1977
Applicant:
Inventor:

Bill Hunt, Snohomish, WA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
3241 / ; 324 / ; 3241 / ;
Abstract

An apparatus for testing the operating state of single and multiple semiconductor junctions, either in or out of circuit. The tester includes a testing circuit which in turn includes a transformer having a secondary with plurality of voltage tap leads, which are selectively connectable by a switching device to a resistance and voltage divider array, which includes means adapted to receive the junction to be tested. The output of the testing circuit is applied to a display circuit which includes a visual indicator, which in turn produces a trace having a configuration representative of the forward and reverse characteristics of the junction, for inspection by an operator. The variety of voltages available at the secondary of the transformer and the variety of resistance and voltage divider combinations available permit the safe testing of a wide variety of junctions, including multiple junctions.


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