The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 1978

Filed:

Aug. 08, 1974
Applicant:
Inventor:

Herwig Horn, Graz, OE;

Assignees:

Pluss-Staufer AG, Oftringen, CH;

Zentrum fur Elektronemikroskopie, Graz Steyrergasse, OE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356212 ; 356210 ; 356104 ;
Abstract

A method and apparatus for determining the reflective characteristic of surfaces, especially coated surfaces, in which a beam of parallel light rays are directed against the surface at a predetermined angle of incidence. The light rays reflecting from the surface at an angle numerically equal to the angle of incidence are caused to converge and are supplied to a receiver which may be in the form of a light sensitive resistor. The light which scatters from the surface by reflecting therefrom at angles numerically different from the angle of incidence are, at least in part, collected and caused to converge and are supplied to a second receiver which may also be in the form of a light sensitive resistor. The changes in values of the resistors when illuminated in the aforesaid manner are compared and thereby a comparison is arrived at of how much light is reflected directly from the surface and how much light is scattered during reflecting.


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