The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 1978

Filed:

Sep. 18, 1975
Applicant:
Inventor:

Frans Brouwer, Glencoe, IL (US);

Assignee:

Stewart-Warner Corporation, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K / ;
U.S. Cl.
CPC ...
266 60 ; 250202 ;
Abstract

A contour tracing apparatus in which the coordinate drive motors are cantilever supported on simple plates and needle thrust bearings to permit the motor pinions to be spring biased into engagement with the respective racks for moving the scanning head and associated tool. Kerf offset is provided by rotation of the scanning head optical assembly about a pivot member, which can be translated along a zero kerf adjustment line to provide forward offset. The pivot member is also eccentrically rotatable in response to rotation of the optical assembly about another axis to properly align the photocells of the optical assembly with a zero kerf mark. The optical assembly includes a plurality of lamps spaced about the photocells and one integral lens structure having annular prism surfaces encircling a convex lens surface to direct light from the lamps to the contour and from the contour to the cells.


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