The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 1978
Filed:
Jun. 07, 1976
Donald L Horrocks, Placentia, CA (US);
Beckman Instruments, Inc., Fullerton, CA (US);
Abstract
A method for the reliable determination of a random coincidence count attributable to chance coincidences of single-photon events which are each detected in only a single detector of a scintillation counter utilizing two detectors in a coincidence counting technique. The method includes the steps of measuring a coincidence count rate as indicated by essentially coincident output pulses from the detectors, measuring a single photon count rate as indicated by output pulses from both of the detectors, whether coincident or not, and determining a random coincidence count rate from the difference between the single photon count rate and the measured coincidence count rate. From the random coincidence count rate thus determined, a percentage error value can be determined, for application, if desired, to subsequently or concurrently measured sample radiation counts.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile