The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 1978
Filed:
Aug. 18, 1976
Ronald N Borrelli, Moraga, CA (US);
Zehntel, Inc., Concord, CA (US);
Abstract
A method and apparatus for automatic, programmed, in-circuit testing of individual logic elements. A plurality of program-operated device connection switches are provided for making connections to the circuit under test. A plurality of program-operated drive circuits are provided for driving nodes of the logic element under test with controlled current, voltage and power to logical 1, logical 0, or a high impedence state. A measurement unit measures an output from the logic element under test. Testing programs are run in a program-controlled processor. The programs have subroutines which correlate with individual types of logic elements. Each logic element is examined, in circuit, independently of neighboring logic elements. A translation memory stores data for translating node addresses to facilitate topology independent subroutine processing of identical elements.