The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 1978
Filed:
Mar. 12, 1976
Daniel Silverman, Tulsa, OK (US);
Geophysical Systems Corporation, Pasadena, CA (US);
Abstract
The method of determining the magnitude of the differential static correction between two selected adjacent receiver points D, E, in a linear seismic array, that involves the steps of: recording a first multi-trace record responsive to a first seismic wave generated at a first source point C on one side of D, E at any distance; recording a second corresponding multi-trace record responsive to a second seismic wave at a second source point F on the opposite side of D, E at any distance; correlating a first trace CE with a second trace CD of the first record to obtain a first time difference R; correlating the corresponding first trace FD with a second trace FE of the second record to get a second time difference S; and determining the value of K = (R - S)/2, where K is a value of the static correction equal to the difference in the travel time through the weathered layer at D and E. The process can be repeated for other positions of C, F to obtain other independent values of K. The various values of K can be averaged to provide an improved value of differential static correction at receiver points D, E. The method is applicable also to determining the differential static correction at two adjacent source points.