The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 1978
Filed:
May. 18, 1976
Shinichi Ohta, Tokyo, JA;
Isao Matsumura, Yokohama, JA;
Kazunobu Kobayashi, Yokohama, JA;
Haruhisa Madate, Yokohama, JA;
Canon Kabushiki Kaisha, Tokyo, JA;
Abstract
The present invention relates to an optical instrument for examining the eye fundus which is so designed that in the optical system including an objective lens visible, targets are built for orientating the visual line of the eye to be inspected along the direction convenient for the inspection of the desired part of the eye fundus in order to be able to inspect the desired part. The visible targets are located at the position conjugate to the eye fundus with regard to the optical system including the objective lens in order that the light beam coming from the targets through the objective lens reaches the eye to be inspected. The image of the visible targets is formed on the eye fundus of the eye to be inspected while the eye to be inspected observes the visible targets through the objective lens in such a manner that the visual line is oriented in the direction along which the targets are seen.