The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 1978

Filed:

Jul. 12, 1976
Applicant:
Inventors:

Arthur C Chen, Schenectady, NY (US);

William D Barber, Ballston Lake, NY (US);

Walter H Berninger, Schenectady, NY (US);

Gerald J Carlson, Scotia, NY (US);

Norman C Gittinger, Schenectady, NY (US);

James R Whitten, Scotia, NY (US);

Assignee:

General Electric Co., Schenectady, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03K / ; G01N / ;
U.S. Cl.
CPC ...
364414 ; 364515 ; 2504 / ; 3403 / ;
Abstract

A tomographic x-ray imaging system comprises a large plurality of parallel data acquisition channels which integrate and digitize signals from an array of x-ray detectors. Calibration pulses are injected into each data acquisition channel to permit measurement of drift in electronic gain and dc offset parameters. Separate x-ray detectors continuously monitor the intensity of the x-ray source. The measured values for channel gains, dc offsets, and source intensity are fed to a digital computer where they are automatically combined with x-ray transmission data to compensate for system drift and extend the period between calibration measurements.


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