The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 1978

Filed:

Jul. 09, 1976
Applicant:
Inventor:

Anthony John Ley, New Canaan, CT (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 / ; 3072 / ; 324 / ;
Abstract

Apparatus for measuring the phase difference between two electrical signals Asin (wt+.theta.), Bsin (wt+.phi.), given a reference signal Vsin wt generated by the apparatus, comprises a phase lock loop for generating a clock frequency f = 360F where F is the frequency of the reference signal. This clock frequency f is then used to tune a 360 stage CCD transversal filter which is used to filter successively the two first-mentioned signals, whose phase difference is then measured by a zero intercept system. The clock frequency f is used to give phase difference in degrees. The phase lock loop comprises a 90-stage CCD to which the reference signal is applied. The output of the CCD is applied to one input of a phase sensitive detector whose other input is connected to receive the reference signal, and the control signal produced by the phase sensitive detector controls a voltage controlled oscillator whose output is applied to the clock input of the CCD.


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