The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 1978
Filed:
Sep. 08, 1976
Applicant:
Inventor:
Masaya Iwanaga, Kyoto, JA;
Assignee:
Shimadzu Seisakusho Ltd., Kyoto, JA;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ; H01J / ;
U.S. Cl.
CPC ...
250296 ; 2503 / ;
Abstract
A mass spectrometer wherein the ion beam is deflected for scanning of a mass spectrum or selection of mass numbers, without changing the magnetic field strength and the ion-accelerating voltage. The means for deflecting the ion beam may be arranged between the ion source and the magnetic field or within the magnetic field or between the magnetic field and the ion detector.
Iwanaga, Masaya. (1978). Scanning mass spectrometer having constant magnetic field (U.S. Patent No. 4066895). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4066895
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile