The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 1977

Filed:

Apr. 20, 1976
Applicant:
Inventors:

Tung Chang Chen, Villanova, PA (US);

Thomas M Chen, Doylestown, PA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
250 ; H04N / ;
U.S. Cl.
CPC ...
358107 ; 358100 ; 358101 ; 358106 ; 250560 ; 250565 ;
Abstract

The present system provides a means to record an image of an item which is extremely difficult to inspect because of its peculiar shape or because the person who is inspecting it cannot come in close proximity thereto, such as red hot glass being measured for form and size immediately upon being formed into a bottle. The present system employs a television camera and logic circuitry to electronically compare the profile of said image against a standard item whereby the item being inspected or measured can either be rejected or accepted.


Find Patent Forward Citations

Chen, Tung. (1977). System for monitoring the production of items which are initially (U.S. Patent No. 4064534). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4064534

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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