The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 1977
Filed:
Jun. 02, 1976
Gastone Albertazzi, Bologna, IT;
Abstract
Apparatus for measuring errors in concentricity relative to first and second coaxial surfaces of rotation formed within a hole of a mechanical part which includes a first support for the part, a second support, a first mechanical reference element supported by the second support to cooperate with the first of the surfaces of rotation, a measurement device associated with the first mechanical reference element to cooperate with the second surface of rotation and effect dimensional measurements thereon, second mechanical reference elements supported by the second support and rigidly connected to the first mechanical reference element, a rigid member connected to the first mechanical reference element, a wire and a spring interconnecting the second support and the rigid member, a spring arranged between the first and second mechanical reference elements and the second support to permit simultaneously the first mechanical reference element to remain in contact with the first surface of rotation and the second mechanical reference elements to cooperate with at least one point of a first section of the second surface of rotation, a mandrel adapted to produce a substantially rotary relative movement between the part and the second support and a processing device connected to the measuring device to carry out during relative motion of the part dimensional measurements on a second section of the second surface of rotation.