The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 1977
Filed:
Jan. 23, 1976
Applicant:
Inventor:
Tsutomu Tojyo, Hachiouji, JA;
Assignee:
Olympus Optical Co., Ltd., , JA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
3501 / ; 350215 ; 350216 ; 350255 ;
Abstract
A microscope objective with correcting means comprising a front lens group arranged on the object side of a pre-determined airspace and rear lens group arranged on the image side of said airspace and arranged to correct aberrations, which will be caused by difference in thickness of the cover glass, by varying said airspace moving the rear lens group in respect to the front lens group so that a favourable image can be obtained for observation.