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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 4058724 B1

PDFFull Text
Date of Patent:
Nov. 15, 1977

Filed:

Jun. 27, 1975

Ion scattering spectrometer with two analyzers preferably in tandem

Applicant:
Inventors:

James T McKinney, Stillwater, MN (US);

Robert F Goff, White Bear Lake, MN (US);

Assignee:

Minnesota Mining and Manufacturing Company, St. Paul, MN (US);

Attorneys:

Alexander; Cruzan

Sell; Donald M.

Barte; William B.

Primary Examiner:

Craig E Church

Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250309 ; 250292 ; 250296 ; 250307 ;
Abstract

Improved apparatus and method for measuring ions scattered from a surface, to thereby determine the mass of atoms at the surface. The apparatus includes two analyzers, preferably an energy analyzer and mass analyzer positioned in tandem. The mass analyzer may be tuned to pass only ions having the same mass as ions in an incident ion beam, and to reject sputtered ions, some of which may have the requisite energy to pass through the energy analyzer under a given set of conditions.

Find Patent Forward Citations

McKinney, James. (1977). Ion scattering spectrometer with two analyzers preferably in tandem (U.S. Patent No. 4058724). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4058724

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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