The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 1977

Filed:

Feb. 23, 1976
Applicant:
Inventor:

Sergei Michael Fomenko, Woodland Hills, CA (US);

Assignee:

Greenwood Mills, Inc., Greenwood, SC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356238 ; 350-6 ; 350-7 ; 356200 ;
Abstract

A system is provided for scanning a laser beam across the width of fabric material to be inspected. A scanning mirror receives coherent light from the beam and is mounted to repeatedly swing through a given scan angle. An optical arrangement of mirrors in side-by-side relationship receives the light beam from the scanning mirror and directs it in successive side-by-side parallel directions or channels towards the fabric to irradiate successive areas of the fabric across its width. A de-scanning mirror is mounted to repeatedly swing through the same given scan angle in synchronism with the scanning mirror and a second optical arrangement of mirrors in alignment with the first mentioned mirrors receives the beam after passing through successive areas of the fabric and directs it to the de-scanning mirror. The beam reflected from the de-scanning mirror in turn can then be analyzed.


Find Patent Forward Citations

Loading…