The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 1977
Filed:
Apr. 02, 1975
Jacques E Ludman, Westford, MA (US);
Other;
Abstract
An interferometer optical system for general use to measure optical parallelism or relative rotational or joint translational positions of the two spaced subject mirrors uses coherent light split into two beams which are directed, one normal to one of the two mirrors and the other normal to the other of the two mirrors. The reflections of these two beams are then superimposed on a target which reveals a light interference pattern indicative of the parallelism or relative rotation or joint translation of the two mirrors. In preferred embodiments, in order to compensate for the mutual tilt of the subject mirrors with respect to the plane of the beams incident thereon, the path of one of the beams to and from the subject mirror includes a corner mirror, or retrodirective mirror, and the path of the other beam includes at least one adjustable mirror.