The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 1977

Filed:

Oct. 18, 1974
Applicant:
Inventors:

Hiroshi Aizawa, Machida, JA;

Kazuya Hosoe, Machida, JA;

Seiichi Matsumoto, Yokohama, JA;

Hideo Yokota, Tokyo, JA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C / ; G03B / ;
U.S. Cl.
CPC ...
356-4 ; 250201 ; 250204 ; 354-4 ; 354 25 ; 354163 ;
Abstract

A method and an apparatus is disclosed for detecting the sharpness of the object image suited for optical instruments such as a camera and for adjusting the focus of the optics by means of photoelectric means presenting a non-linear resistance-illumination characteristics such as CdS or CdSe. Such an object image may be formed by means of the optics on the above mentioned photoelectric means presenting the electrodes at both ends along the longer side of a photoelectric semiconductor whose longer side is extremely long as compared with the shorter side as well as on the above mentioned photoelectric means presenting the electrodes at both ends along the shorter side of the photoelectric semiconductor. An object distance measuring system which digitally displays the distance between camera and photographing object when an automatic focusing operation is carried out is also disclosed.


Find Patent Forward Citations

Loading…