The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 1977

Filed:

Apr. 27, 1973
Applicant:
Inventors:

Perry Dwaine Hampton, Dallas, TX (US);

James R Cox, Richardson, TX (US);

Assignee:

Cosar Corporation, Garland, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ; G01N / ;
U.S. Cl.
CPC ...
356188 ; 356210 ;
Abstract

A digital reflection densitometer system comprises a power supply unit and a digital reflection densitometer instrument which is connected to the power supply unit by means of an electrical cable. The instrument is manually positionable over a surface and includes a housing which is supported on a foot. The foot is adapted for engagement with the surface and includes target apparatus for designating a predetermined area of the surface. The housing is normally pivotally separated from the foot by a spring and is manually pivotable to an operating position adjacent the foot. A plurality of lamps are mounted in the housing for illuminating the predetermined area of the surface when the housing is in the operating position. Light reflected from the predetermined area is directed through an optical system to a light sensitive apparatus comprising a planar silicon sensor. The output of the planar silicon sensor is directed through an operational amplifier and a logarithmic amplifier to a digital volt meter which actuates a digital display device mounted in the housing of the instrument to provide a visual digital readout indicative of the output of the planar silicon sensor. The instrument further includes apparatus for selectively positioning any one of a plurality of filters in the path of light passing through the optical system to the planar silicon sensor, and for simultaneously adjusting the gain of the operational amplifier and the sensitivity of the digital volt meter to compensate for differences between the filters.


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