The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 1977

Filed:

Nov. 20, 1975
Applicant:
Inventors:

Raiji Shimomura, Kokubunji, JA;

Toru Habu, Hachioji, JA;

Hisaaki Itoh, Mie, JA;

Naomi Sakai, Kanagawa, JA;

Tatsuo Goto, Hamura, JA;

Assignees:

Hitachi, Ltd., BOTH OF, JA;

Hitachi Metals, Ltd., BOTH OF, JA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
73105 ; 3314 / ;
Abstract

In a detecting device of the unevenness of a curved surface of an object, the detecting device is characterized by providing means for seizing or holding the object, means for moving the seizing means in a predetermined direction, a variation detector for detecting the presence of a projection or a recess on the surface of the object, a supporting means including at least two contact members which contact the surface of the object for supporting the variation detector at a position corresponding to the position of the surface, and means for guiding the supporting means in response to the position variation of the surface.


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