The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 1977
Filed:
Nov. 14, 1975
Applicant:
Inventors:
Toshihiro Mori, Yokohama, JA;
Seigo Ando, Kawasaki, JA;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 40 ;
Abstract
When a negative resistance is connected in parallel to a parallel resonance circuit composed of coil and condenser for detecting flaws and other defects of a travelling metal material, the detecting system is capable of improving sensitivity for detecting said flaws and lowering the required degree of amplification of the following amplifier, consequently reducing influence depending upon unbalance of a bridge circuit. At the same time, the simplifying of the power source of said system may be easily realized.
Mori, Toshihiro. (1977). Eddy current flaw detector using a pair of parallel resonant circuits (U.S. Patent No. 4050011). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4050011
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile