The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 1977

Filed:

Aug. 12, 1975
Applicant:
Inventors:

Helmut Berger, Erlangen, DT;

Gunther Holzermer, Erlangen, DT;

Harry Kirsch, Erlangen, DT;

Pieter Vijlbrief, Leiden, NL;

Assignee:

Siemens Aktiengesellschaft, Berlin & Munich, DT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
2504 / ; 250476 ;
Abstract

An X-ray examining apparatus including a tomographic exposure installation, with an adjusting or positioning drive for the laminagraphic height displacement, as well as an installation for effecting the marking or indentifying of the currently set laminagraphic height on the tomographic X-ray exposures. In an X-ray examining apparatus of the above-mentioned type there is, accordingly, inventively associated with the X-ray film sheets which are being exposed, a scale or graduated dial which is provided with laminagraphic height gradations and coupled with the positioning drive for the laminagraphic height for the imaging of the area identifying the currently set laminagraphic height.


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