The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 1977

Filed:

Apr. 22, 1976
Applicant:
Inventor:

Roderick D Swift, Belmont, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73 1 / ; 356203 ;
Abstract

A system by which in situ observations of optical damage induced in optical omponents by intense thermal radiation may be made. The process includes the determination of the spectral transmission wherein a scanning monochromator is used to illuminate the sample elements with a light beam of monotonically changing wavelength, and the transmitted light is detected and its intensity recorded as a function of wavelength. Optical damage is detected by the resultant changes in the spectral transmission curve.


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