The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 1977

Filed:

Feb. 11, 1976
Applicant:
Inventors:

Curtis G Dell, Newark, DE (US);

James A Williamson, Jr, Newark, DE (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
2323 / ; 2323 / ; 2325 / ; 7342 / ; 7342 / ; 141 83 ; 356246 ;
Abstract

Apparatus and method for gas analysis in which a sample gas is introduced into a high pressure sample cell through a long narrow holding tube, having a volume greater than the volume of the sample cell; and a second gas which will not interfere with the analysis is introduced into the holding tube behind the sample gas, at a pressure sufficient to force a portion of the sample gas contained in the holding tube into the sample cell so that the pressure of the sample gas in the sample cell is increased. An analysis of the sample gas in the sample cell is then made by a suitable technique, preferably by photometric analysis.


Find Patent Forward Citations

Dell, Curtis. (1977). Apparatus and method for gas analysis (U.S. Patent No. 4042333). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4042333

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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