The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 1977

Filed:

Jul. 02, 1975
Applicant:
Inventor:

Cyril Arthur Lee, Maidenhead, EN;

Assignee:

E M I Limited, Hayes, EN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 / ; 235 / ; 235 / ; 235 / ; 3401 / ;
Abstract

Apparatus to examine a magnetic storage layer expected to contain a magnetic watermark includes means to magnetize the layer with a unidirectional field of a selected strength without saturating it and means to detect any distinct region of magnetic remanence. The apparatus may further include means to record the resultant remanence levels (or their ratio) for such a region and another part of the layer, means to magnetize the layer with a unidirectional field of a different selected strength, means to detect any then-existing such distinct region or regions, means to measure the remanence levels (or their ratio) for the then-existing such region and another part of the layer, and means to compare the measured and recorded levels (or their ratios) and indicate from the result of the comparison whether or not this represents a layer having a magnetic watermark of regions of distinctly aligned anisotropic magnetic particles. The use of different amounts of magnetization will produce different ratios of remanence in a layer having such a watermark but not in an homogenous layer.


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