The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 1977
Filed:
Jun. 14, 1976
Robert Edward Auer, Miami, FL (US);
Howard E Tucker, Los Alamos, NM (US);
Coulter Electronics, Inc., Hialeah, FL (US);
Abstract
A method and apparatus for simultaneous optical measurement of several characteristics of each particle of a group of small particles while the particles are suspended in a liquid. The apparatus includes a sample passage structure through which the particles pass, and a first optical detector structure which receives light from the sample passage structure. The sample passage structure and detector are aligned one with respect to the other. The output of a source of light is directed to the sample passage structure by an alignment device which aligns the light and the sample passage structure. A second optical detector receives the light passed by the sample passage structure. The second detector includes a converging lens and a photodetector so positioned with respect to one another that the light pattern at the detector due to the passage of a particle through the sample passage structure will maintain a substantially constant intensity notwithstanding movement of the sample passage structure, particle or the light.