The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 1977
Filed:
Nov. 24, 1975
Horiba, Ltd., Kyoto, JA;
Abstract
A sample cell useful in fluorescent X-ray analytical devices is provided herein, which cell is composed of an inner frame; an inner frame cover and a radiation-permeable sheet which houses the sample to be analyzed and an outer frame which covers the sample. The inner frame cover which is formed by bending a soft plastic film and the radiation-permeable sheet are such that they may be discarded after each analysis whereas the inner frame and the outer frame are used for reinforcement and sealing up of the sample and are never contaminated with the sample to be analyzed. Since the inner frame cover and the X-ray permeable sheet are the only members of the sample cell which contact the sample to be analyzed, these portions have been made from inexpensive disposable materials so that they can be discarded after each X-ray analysis, thereby eliminating the need to wash the sample cell after each analysis. Since the inner frame and the outer frame are not in contact with the sample to be analyzed, these portions may be used repeatedly in conjunction with each new disposable inner frame cover and radiation-permeable sheet. According to the present invention, the troublesome and laborious cleaning operation necessary in conventional sample cells is eliminated and further, contamination of the hands or clothes by the sample to be analyzed is prevented.