The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 1977

Filed:

Nov. 13, 1975
Applicant:
Inventors:

Minoru Oda, Amagasaki, JA;

Shinji Badono, Amagasaki, JA;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250272 ;
Abstract

A fluorescent X-ray sulfur analyzer is disclosed and includes a radiation source for irradiating a sample with X-rays or .gamma.-rays, a radiation detector for detecting the radiation generated from the sample irradiated by the X-rays or .gamma.-rays and a first analyzer for selecting only fluorescent X-ray pulses from the output of the detector. The analyzer further includes a first pulse rate measuring device for measuring the pulse rate of the pulses selected by the first analyzer, a second analyzer for selecting only pulses of compton scattered rays from the output of the detector and a second pulse rate measuring device for measuring the pulse rate of the pulses selected by the second analyzer. An operational circuit is provided for operating the outputs of the first and second pulse rate measuring devices and is calibrated to compensate for the error caused by the variation of the carbon-hydrogen ratio to realize an accurate weight content of the sulfur in the sample.


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