The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 1977

Filed:

Aug. 10, 1976
Applicant:
Inventor:

Alain Deficis, Toulouse - Cedex, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K / ;
U.S. Cl.
CPC ...
73368 ; 733682 ; 240 / ; 2502 / ; 356209 ;
Abstract

A process and a probe for measurement of temperatures of a given medium and also for measurement of the density of electromagnetic power of a medium at a given temperature is provided wherein a beam of light is transmitted into a capillary enclosure containing a liquid having a reflecting meniscus so that light is reflected from said meniscus and the reflected light is transmitted out of said enclosure whereby the intensity of reflected light can be measured as compared to that of the incident light.


Find Patent Forward Citations

Deficis, Alain. (1977). Temperature measuring process and probe (U.S. Patent No. 4036060). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4036060

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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