The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 1977
Filed:
Jul. 09, 1976
Applicant:
Inventors:
Dietmar Leeb, Zurich, CH;
Marco Brandestini, Zurich, CH;
Assignee:
Proceq SA, Zurich, CH;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73 79 ; 73 12 ;
Abstract
A method of, and apparatus for, testing the hardness of a material by means of an impact device wherein an impact body having a test tip or point which is either integrated, e.g., connected with, or separate from, the impact body is brought to impact against the material to be tested. There is determined the velocity of the impact body and/or the test tip both directly before and after impact, and there is then formed a characteristic value from both velocities which is utilized as criterion for the hardness of the material.