The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 1977
Filed:
Nov. 10, 1975
Bradford E Kruger, Woodland Hills, CA (US);
International Telephone and Telegraph Corporation, New York, NY (US);
Abstract
A sequential-lobing, radar, tracking device, particularly adapted to radars which scan mechanically in the azimuth plane and which have frequency-phase scan in addition. The phase scan operates to displace the beam in the vertical or elevation plane substantially normal to the plane of mechanical scan. Frequency scan provides a form of scan vernier and provides at least a substantial scan component in the direction of mechanical scan. The frequency scan is programmed to employ the time delay introduced between two vernier azimuth beam pair positions by the mechanical scan in azimuth, so that azimuth measurements, i.e., as between beams which tend to bracket a target, are made at the same transmitted frequencies. The azimuth measurement is therefore independent of frequency scintillation effects resulting from the unpredictable variation of radar target cross-section as a function of frequency.