The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 1977

Filed:

Feb. 25, 1974
Applicant:
Inventors:

Richard M Malueg, Glendora, CA (US);

Michael J Meier, Monrovia, CA (US);

Assignee:

McDonnell Douglas Corporation, Long Beach, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ; H04N / ;
U.S. Cl.
CPC ...
358213 ;
Abstract

In an electronic system employing an array of detectors which have been compensated for any fixed pattern noise present, further compensation is provided for any deviation in sensitivity (gain) of each detector from a standard by measuring the output of each detector under uniform level of incident energy, and comparing the amplitude measured with a standard while multiplying the measured output by a factor that is varied until the product equals the standard. The final factor is then stored for use as a gain compensation factor during normal system operation.


Find Patent Forward Citations

Malueg, Richard. (1977). Detector array gain compensation (U.S. Patent No. 4032975). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4032975

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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