The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 1977
Filed:
Mar. 23, 1976
Shigeru Sonobe, Katsuta, JA;
Makoto Watanabe, Katsuta, JA;
Iwao Kato, Mito, JA;
Tomoyoshi Sato, Sapporo, JA;
Hitachi, Ltd., , JA;
Abstract
There is provided a multi-functional spectrophotometer allowing various measurements in which a stigmatic concave grating is employed for selecting the wavelength of the measuring light. A number of miniature type detectors are employed for detecting the diffracted light from the concave grating. Cells containing samples to be measured can be positioned either adjacent to inlet slits at the side of a light source or behind exit slits. These positions of the cells can be easily changed over one with the other. In the former position, absorbances (concentrations) of sample components for a plurality of predetermined light wavelengths can be simultaneously measured. In the later position, not only the absorbance characteristic curve of the sample can be determined, but also the absorbance, fluorescence and turbidity of the sample for a give wavelength can be measured.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile