The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 1977

Filed:

Sep. 18, 1975
Applicant:
Inventors:

Walter L Bond, Los Altos, CA (US);

Cassius C Cutler, Holmdel, NJ (US);

Ross A Lemons, Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73 6 / ; 73 677 ;
Abstract

An acoustic microscope for scanning an object stereo-optically and with both dark field and light field imaging. The microscope focuses acoustic waves on a focal point and moves the object in a planar raster pattern through the focal point. The acoustic waves are modulated by the object and displayed on an oscilloscope. The microscope permits the rotation of the object about the focal point so that two, azimuthally displaced images of the object can be obtained. These two images can be observed as one three-dimensional image in a lenticular stereoscope. In addition, the microscope can scan the acoustic waves scattered by the object and display a dark field image of the object.


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