The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 1977
Filed:
Jul. 30, 1976
Applicant:
Inventors:
Robert E Alvarez, Stanford, CA (US);
Albert Macovski, Palo Alto, CA (US);
Assignee:
The Board of Trustees of Leland Stanford Junior University, Stanford, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ; G01N / ; H05G / ;
U.S. Cl.
CPC ...
250360 ; 250369 ; 2504 / ; 250510 ;
Abstract
Projection measurements are made of the transmitted x-ray beam in low and high energy regions. These are combined in a non-linear processor to produce atomic-number-dependent and density-dependent projection information. This information is used to provide cross-sectional images which are free of spectral-shift artifacts and completely define the specific material properties.